IEEE 1149.7

IEEE 1149.7 is complementary superset of the widely adopted IEEE 1149.1 (JTAG) standard that has been in use for more than two decades. IEEE 1149.7 was ratified by the IEEE in Dec 2009. The persistent link to the specification at the IEEE is at http://ieeexplore.ieee.org/servlet/opac?punumber=5412864.

While IEEE 1149.7 adds substantial functionality to the existing standard, it is important to note that it is not a replacement for IEEE 1149.1. Backward compatibility is maintained so that any board or system that integrates chips that support either standard is amenable to test or debug procedures.

Benefits

The new standard offers embedded designers several benefits, including:

The ability to control debug logic power consumption in an industry standard way. Whereas IEEE 1149.1 (JTAG) had a single "always on" state, IEEE 1149.7 offers four selectable power modes to enable ultra-low power devices.
The ability to quickly access a specific device in a system with multiple devices. By implementing a system level bypass, the scan chain is drastically shorter, which directly improves the debugging experience.
The introduction of a star topology to complement the standard serial topology. Designers working with stacked-die devices, multi-chip modules and plug-in cards will favor the star topology because it simplifies the physical inter-device connections.
Two-pin operation instead of the four-pin operation required in IEEE 1149.1. Since most of today's systems integrate multiple ICs and often have severe size constraints, reducing the number of pins and traces will help designers meet their form factor goals and allowing for additional functional pins and/or low package cost.
Compatibility with existing IEEE 1149.1 (JTAG) compliant IP, allowing preservation of investment.

Relationship to Other Standards

IEEE 1149.1 (JTAG) is the predecessor to IEEE 1149.7.
IEEE 1149.6 is focused on boundary-scan testing for advanced digital networks.
IEEE 1149.7 is a complementary superset of IEEE 1149.1.
IEEE 1500 is a scalable standard architecture for enabling test reuse and integration for embedded cores and associated circuitry.
IEEE P1687 is developing a methodology for access to embedded test and debug features, to include a description language.
IEEE-ISTO 5001 is the NEXUS debug standard. IEEE 1149.1 is a connection type used by NEXUS. IEEE 1149.7 will be included in the new revision of the NEXUS debug specification.
MIPI is the Mobile Industry Processor Interface Alliance, and IEEE 1149.7 is a recommended Test and Debug interface. (see the MIPI T&D White Paper Interface Framework (.pdf))

Status

IEEE 1149.7 has been ratified as a standard by the IEEE in Dec 2009.
The standard is available from the IEEE.

Presentations

Presentation from SWDFT 2009 is here: Media:IEEE1149.7overview.pdf
The importantance of standards Media:IEEE1149.7importanceofstandards.pdf

Press

IEEE 1149.7 official webpage is here
TI press release is here
Embedded Systems Magazine article is here
IPeXtreme press release is here or here
SCDsource article is here
ASSET InterTech press release is here
Freescale press release is here
Corelis press release is here
Embedded Computing Design article here
Wireless Design and Development article on "Debug in End Packages Now Possible" is here (see sidebar)
IPeXtreme newsletter article on "Nascent 1149.7 complements venerable 1149.1 JTAG" is here
ASSET InterTech newsletter article on "New 1149.7 enhances 1149.1 test access port, maintains compatibility for boundary scan" is here
IPeXtreme article one "Adding Physical Test and Debug Access to Chips with a Compact JTAG Core" in ChipEstimate.com is here.
IEEE 1149.7 Overview at Southwest Design for Test Conference (SWDFT) Austin, Texas April 2009. Presentation
The next generation in test and debug solution: IEEE 1149.7
Evaluation Engineering: IEEE 1149.7 Expands JTAG Functionality
Design-Resuse Magazine Embedded Instrumentation Integration Using IEEE Nexus 5001 and 1149.7
EDN: Embedded Instrumentation Integration Using IEEE Nexus 5001 and 1149.7
Major Benefits of IEEE 1149.7 (White paper) or alternate link
IPeXtreme Blog
Myth Busted: IEEE 1149.7 does not replace IEEE 1149.1
Solving accessibility issues